Gomory F., Vogel M., Seiler E., Valizadeh R., Ries R., Malyshev O.B., Medvids A., Onufrijevs P., Pira C., Chyhyrynets E., Leith S.
Vogel M., Seiler E., Valizadeh R., Junginger T., Burt G., Ries R., Malyshev O.B., Medvids A., Onufrijevs P., Pira C., Chyhyrynets E., Leith S., Sublet A., Turner D.A.
Ключевые слова: LTS, Nb, magnetron sputtering, substrate Cu, surface, microstructure, laser application, measurement setup, magnetization, magnetometer
Molina-Luna L., Jiang T., Alff L., Major M., Karabas N., Pietralla N., Schafer N., Gunzing D., Arzumanov A., Motta-Meira D., Ollefs K., Komissinskiy P., Arnold M., Wende H., Lutzenkirchen-Hecht D.
Ключевые слова: HTS, GdBCO, coated conductors, tapes, magnetron sputtering, overcurrent, ac performance, stabilizing layers, surface, plasma treatments, microstructure, roughness, experimental results
Ключевые слова: magnetron sputtering, films, microstructure, resistivity, temperature dependence, X-ray diffraction
Ключевые слова: LTS, Nb3Sn, films, fabrication, magnetron sputtering, substrate Cu, insulation coating, Nb, thickness dependence
Ключевые слова: experimental results, chalcogenide, FeSeTe, coated conductors, PLD process, substrate Hastelloy, IBAD process, buffer layers, magnetron sputtering, targets, X-ray diffraction, thickness dependence, lattice parameter, resistive transition, critical temperature, microstructure, critical current density, pnictides, comparison, critical caracteristics, upper critical fields, Jc/B curves, temperature dependence, pinning force
Ключевые слова: LTS, Nb3Sn, films, fabrication, magnetron sputtering, bronze process, substrates, X-ray diffraction, microstructure, composition, critical temperature
Ключевые слова: HTS, YBCO, bulk, fabrication, magnetron sputtering, targets, new, infiltration process, heat treatment, microstructure
Doi T., Tanaka H., Matsumoto A., Horii S., Kodama M., Kotaki H., Kusunoki T., Iwanaka T., Kawayama I.
Antonov A.V., Ikonnikov A.V., Masterov D.V., Mikhaylov A.N., Morozov S.V., N.Nozdrin Y., Pavlov S.A., Parafin A.E., Tetel’baum D.I., Ustavschikov S.S., Vasiliev V.K., Yunin P.A., Savinov D.A.
Ключевые слова: HTS, YBCO, thin films, substrate LaAlO3, chemical solution deposition, fabrication, multilayered structures, magnetron sputtering, protection layer Ag, protection layer Au, interfaces, critical caracteristics, critical current density, heat treatment, microstructure, Raman spectroscopy, experimental results
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